XH GST212W Wafer-Level Uncooled Infrared Detector
XH GST212W Wafer-Level Uncooled Infrared Detector - 图片 2
XH GST212W Wafer-Level Uncooled Infrared Detector - 图片 3

XH GST212W Wafer-Level Uncooled Infrared Detector

Designed for Emerging Markets and Mass Adoption

The GST212W is a wafer-level packaged (WLP) uncooled infrared detector with a 256×192 resolution and 12 μm pixel pitch, optimized for SWaP applications.

Its compact size, low weight, and cost efficiency enable large-scale production, making it ideal for consumer electronics, smart home devices, and other emerging thermal imaging applications.

Resolution: 256 × 192

Pixel Pitch: 12 μm

Spectral Range: 8–14 μm

Typical NETD: ≤ 40 mK

分类：
Product Features

Lightweight Design

Ultra-compact size: 10.53×7.44×1.45 mm (excluding PCB)
Ultra-light weight: as low as 0.5 g

High Detector Sensitivity

High sensitivity with typical NETD < 30 mK
Low power consumption design

Consumer-Grade Applications

Mass-market deployment
Cost-effective infrared integration

Applications
  • Gas Leak Detection
    Gas Leak Detection
  • Gas Leak Detection
    Gas Leak Detection
  • Gas Leak Detection
    Gas Leak Detection
  • Gas Leak Detection
    Gas Leak Detection
Technical Specifications
Product ModelGST212W Uncooled Infrared Detector
Sensitive MaterialVanadium Oxide (VOx)
Array Format256×192
Pixel Pitch12μm
Spectral Range8-14μm
Typical NETD<40mK
Output SignalBuilt-in 14-bit ADC
Thermal Response Time<12ms
Maximum Frame Rate50Hz
Power Consumption≤75mW
Dimensions (mm)10.53×7.44×1.45 (excluding PCB)
Weight<0.5g
Operating Temperature-40°C ~ +85°C

 

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